Controlled Semiconductor, Inc.
Controlled Semiconductor, Inc. Controlled Semiconductor, Inc.
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 Controlled Semiconductor, Inc.
Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc. Controlled Semiconductor, Inc.

mit +1500


PROVISION™ DEFECT DETECTION SYSTEM

•Both Transmitted and Reflected Illumination (optional)

• Multi-Variant Defect Analysis

• Custom Reporting

• Defect Detection to less than 1µm